## Treatise on Materials Science and Technology, Volume 4 |

### From inside the book

Results 1-3 of 89

Page 2

Generally , emphasis will be

Generally , emphasis will be

**given**to those techniques which are usually readily available in most research and development laboratories . Some of the properties that one would like to measure in such a characterization are as follows ...Page 93

That is , CQ is the product of the jump rate of a

That is , CQ is the product of the jump rate of a

**given**type divided by the average frequency . Then , rc , is the jump rate of the**given**type . The jump rate of a**given**type is the product of the probability that the vacancy and solute ...Page 294

For a

For a

**given**reduction in height , the diameter will expand to a lesser degree than fully dense material . Therefore , the Poisson ratio for plastic deformation of a sintered powder material will be less than one - half , and will be a ...### What people are saying - Write a review

We haven't found any reviews in the usual places.

### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

6 other sections not shown

### Other editions - View all

### Common terms and phrases

activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent specimen strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations X-ray yield